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"Comparative study of ion track profiles in amorphous SiO2 by TEM and AFM observations"
G. Saint Martin, O.A. Bernaola and G. García Bermúdez
Proc. of the "6th International Symposium on Swift Heavy Ions in Matter" (SHIM 2005), Aschaffenburg, Germany, May 28-31, 2005. Ed. R. Neumann, P. Apel, M. Toulemonde and C. Trautmann
Nucl. Instrum. Meth. B 245(1) (2006) 274-276
The extension and shape of damaged material produced by ion projectiles can be analyzed in single track profiles, obtained in samples prepared using the folding track replica technique and observed by transmission electron microscopy. Until now, this technique has been mainly applied to organic materials. In the present work, the technique is used to evaluate single track profiles in amorphous SiO2 and the results are compared with those obtained by AFM tapping mode observations.
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